Features
Everything in the suite
16 modules covering the reliability lifecycle end to end — each with the statistics, plots and confidence intervals you’d expect from dedicated software, all in one workspace.
Life Data Analysis
Fit 13 distributions to censored life data and rank them automatically.
- 13 distribution fitters: Weibull (2P/3P), Exponential (1P/2P), Normal, Lognormal (2P/3P), Gamma (2P/3P), Loglogistic (2P/3P), Beta, Gumbel
- MLE, RRX and RRY fitting methods with censored (suspended) data support
- Fit_Everything ranks all distributions by AICc, BIC or Anderson–Darling
- Weibull mixture, competing risks, DSZI and grouped models — all with parameter confidence intervals
- Kaplan–Meier and Nelson–Aalen estimators, stress-strength interference, and a quick R/F/f/h calculator
- Compare Folios: likelihood-ratio tests, overlaid confidence contours, folio-vs-folio interference
Accelerated Life Testing (ALT)
Project use-level life from stress tests across 24 ALT model classes.
- 24 ALT fitter classes — 6 life-stress models × 4 base distributions
- Arrhenius, Eyring, Power (IPL), Dual-Exponential, Power-Exponential and Dual-Power models
- Fit_Everything_ALT ranking, plus delta-method confidence intervals on extrapolated B50 life
- Consolidated Test Planner (non-parametric Method 1, parametric Weibull 2A/2B) and OC curves
- Acceleration-factor calculator and interactive life-stress plots
Failure Rate Prediction
Part-stress reliability prediction per MIL-HDBK-217F Notice 2.
- Part-stress analysis across every MIL-HDBK-217F category — microcircuits, semiconductors, passives, connectors and more
- All 14 environments, quality levels and π-factor breakdowns, with overridable factors
- ANSI/VITA 51.1 supplement for COTS quality adjustment
- CustomPart and GenericPart for user or field-data failure models
- SystemFailureRate rollup: λ (FPMH), MTBF, mission R(t), nestable System Blocks and a contribution pie chart
System Reliability (RBD)
Drag-and-drop reliability block diagrams with importance measures.
- Drag-and-drop canvas with Series, Parallel, K-of-N and Network (path-set) configurations
- Nested block builder and automatic layout
- System reliability computation and minimal path sets
- Birnbaum, Criticality, RAW and RRW importance measures
Fault Tree Analysis (FTA)
Build fault trees and compute minimal cut sets with MOCUS.
- Drag-and-drop gates: AND, OR, VOTE (k-of-n), PAND, XOR, NOT and Transfer
- Top-event probability computation
- MOCUS minimal cut sets — clickable to highlight on the diagram
- Birnbaum, Fussell–Vesely, RAW and RRW importance measures
Reliability Growth & Repairable Systems
Crow-AMSAA and Duane growth tracking with trend tests.
- Crow-AMSAA (NHPP power law) with MLE estimation and the Duane graphical method
- Growth rate, cumulative and instantaneous MTBF, Cramér–von Mises goodness of fit
- Failure- and time-terminated test support
- Repairable-system tools: ROCOF/Laplace trend test and mean cumulative function (MCF)
Maintenance Planning & Availability
Optimize PM policies, availability, spares and lifecycle cost.
- Inherent, achieved and operational availability with downtime-breakdown visualization
- Poisson spare-parts provisioning and lognormal repair-time rollup (Mct, Mmax)
- Age vs. block preventive-replacement comparison with optimal interval and cost per unit time
- MFOP / service-interval targeting with sawtooth reliability curves
- Cost forecasting and a tornado sensitivity chart for operational availability
Human Reliability Analysis (HRA)
Nine HRA techniques from THERP and HEART to an extended CREAM engine.
- Quantitative calculators: THERP, HEART, SPAR-H, CREAM basic and SLIM-MAUD
- Structured worksheets: ATHEANA, SHERPA, MERMOS and JHEDI
- Extended CREAM engine with cognitive-activity steps and control-mode chart
- Overview tab comparing the latest HEP across all methods
Reliability Allocation
Apportion a system reliability/MTBF target across subsystems.
- Top-down apportionment across series subsystems
- Equal, ARINC, AGREE and Feasibility-of-effort methods
- One-click BOM and failure-rate import from the prediction folio
- Allocated-reliability bar chart and meets-target badge
Markov Models (State-Space)
Continuous-time Markov chains for repairable systems.
- CTMC modeling of repairable systems as states and transition rates
- Steady-state availability, MTBF, MTTF, mean up time and MTTR
- Time-dependent state-probability evolution
- Transition rates linkable from fitted Life Data distributions
Physics of Failure
Ten mechanistic models from Basquin fatigue to electromigration.
- S-N (Basquin), Ramberg–Osgood, Larson–Miller creep and Miner’s rule
- LEFM fracture mechanics with Paris-law crack growth
- Coffin–Manson strain-life and Norris–Landzberg solder fatigue
- Black’s equation, Peck’s model and Arrhenius acceleration
Warranty Data Analysis
Nevada-chart warranty data to distribution fits and return forecasts.
- Editable Nevada-chart shipment/return matrix
- Conversion to life data (failures + right-censored)
- Distribution fitting and conditional-CDF return forecasting
- Forecast table and bar chart
Degradation Analysis
Extrapolate degradation paths to a failure threshold.
- Non-destructive repeated-measure path extrapolation to a failure threshold
- Destructive location-parameter-vs-time MLE
Statistical Modeling
Descriptive stats, regression/ML and hypothesis tests over one dataset.
- Descriptive statistics with run/box/violin/raincloud plots, scatter-matrix and correlation heatmaps
- Regression & ML: linear, polynomial, ridge, lasso, elastic-net, logistic, trees/ensembles, SVM, KNN and neural nets
- Residual diagnostics, plain-English interpretation, single-point prediction and batch CSV scoring
- t-tests, ANOVA (incl. mixed & repeated-measures), chi-square and non-parametric tests
- Stale-results indicator prompts a re-run when the underlying data changes
Six Sigma Toolkit
Capability, Gage R&R, SPC, DOE and predictive analytics.
- Process capability: Cp, Cpk, Pp, Ppk with ISO 22514-4 non-normal percentile method and Box-Cox suggestion
- MSA / Gage R&R measurement-system analysis
- SPC control charts: I-MR, Xbar-R/S, p, np, c, u with Western Electric rules
- Design of Experiments: effects, %contribution, Lenth’s margin, Pareto, half-normal and interaction plots
- Predictive analytics: decision tree, random forest, gradient boosting, SVM, KNN, AdaBoost, neural net and CHAID
Reliability Demonstration, Probability Plotting & Stress-Strength
Focused calculators that round out the suite.
- Reliability Demonstration Testing: binomial sample size, parametric Weibull planning and OC curves
- Probability plotting: linearized plots for every distribution with rank-adjusted censoring
- Stress-strength interference by numerical integration over any two distributions
Ready to try it?
Install locally in a few commands, or read the full documentation.